<?xml version="1.0" encoding="UTF-8"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-19T01:09:12Z</responseDate><request verb="GetRecord" identifier="oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/11905" metadataPrefix="oai_dc">https://ebyu-rdlopen.rawdatalibrary.net/oai/request</request><GetRecord><record><header><identifier>oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/11905</identifier><datestamp>2026-10-18T20:39:20Z</datestamp><setSpec>openaire</setSpec><setSpec>driver</setSpec><setSpec>com_ebyu_10000</setSpec><setSpec>col_ebyu_10001</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>Production and Characterization of Zn1 –xFexS Thin Films by Ultrasonic Chemical Spray Deposition Technique</dc:title><dc:creator>Solakyildirim, Tuba</dc:creator><dc:creator>Alver, Umit</dc:creator><dc:subject>absorption spectrum</dc:subject><dc:subject>chemical spray pyrolysis</dc:subject><dc:subject>Zn&lt;sub&gt;1 –&lt;/sub&gt;&lt;sub&gt;x&lt;/sub&gt;Fe&lt;sub&gt;x&lt;/sub&gt;S thin films</dc:subject><dc:description>In this study, Zn1 –xFexS thin films were synthesized using the chemical spray pyrolysis technique at a substrate temperature of 450°C and with varying Fe concentrations. The spraying solution was prepared by combining distilled water with 0.05 M zinc chloride (ZnCl2), 0.05 M iron chloride (FeCl3⋅6H2O), and 0.2 M thiourea ((NH2)2CS). The initial solution was atomized onto heated glass substrates using an ultrasonic nebulizer operating at a frequency of 1.63 MHz and dry air. The morphology of the films was examined by scanning electron microscopy (SEM). The crystal structures were determined by X-ray diffraction analysis (XRD). The optical properties of the films were analyzed using a UV spectrometer. The energy band gap of the films was defined using the absorption spectrum. © Pleiades Publishing, Ltd. 2024.</dc:description><dc:publisher>Pleiades Publishing</dc:publisher><dc:date>2024</dc:date><dc:type>Article</dc:type><dc:identifier>https://rdlopen.rawdatalibrary.net/r/ebyu/11905</dc:identifier><dc:identifier>https://doi.org/10.1134/s1063783424600857</dc:identifier><dc:identifier>1063-7834</dc:identifier><dc:language>en</dc:language><dc:relation>Physics of the Solid State</dc:relation><dc:rights>info:eu-repo/semantics/openAccess</dc:rights><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/11905</dc:identifier></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>