2026-10-19T02:04:01Zhttps://ebyu-rdlopen.rawdatalibrary.net/oai/requestoai:ebyu-rdlopen.rawdatalibrary.net:ebyu/138192026-10-18T20:39:14Zopenairedrivercom_ebyu_10000col_ebyu_10001The effect of enhancement factor on the angular dependence of L x-ray intensity ratios for Sm, Hf, Pb and UAkkuş, TubaYılmaz, DemetUğurlu, MineAngular dependenceEnhancement factorL X-raysCerium oxideEnergy dispersive spectroscopyX rayshafniumleadsamariumuraniumBinary systemsEnhancement effectsIntensity ratioScattering anglesX-ray intensity ratiosArticlefluorescencegamma radiationgeometryphotonradiation scatteringradiological parametersX rayX ray detectorsThe effect of enhancement factor on the angular dependence of Ll/Lγ, Lα/Lγ and Lβ/Lγ X-ray intensity ratios for Sm, Hf, Pb and U elements have been measured by using the 59.54 keV photon energy. The binary systems are prepared as Sm-CeO2, Hf-CeO2, Pb–CeO2 and U–CeO2. The samples have been analyzed in EDXRF system. The measurements are made in scattering angles of 85°, 95°, 105°, 115° and 125°. The L X-ray spectra from different samples were detected by a Si(Li) detector. The results show that the intensity ratios of L X-rays to be greater than expected due to the enhancement effect. © 2019 Elsevier LtdElsevier Ltd2020Articlehttps://rdlopen.rawdatalibrary.net/r/ebyu/13819https://doi.org/10.1016/j.radphyschem.2019.1084990969-806XenRadiation Physics and Chemistryinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/13819