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Chemically synthesis and characterization of MnS thin films by SILAR methodYildirim, M. AliYildirim, Sümeyra TunaCavanmirza, IlkeAteş, AytunçFilm thicknessGlassRefractive indexScanning electron microscopySubstratesX ray diffractionGlass substratesOptical and electrical propertiesPolycrystallineResistivity valuesSILAR methodSynthesis and characterizationsThin filmsMnS thin films were synthesized on glass substrates using SILAR method. The film thickness effect on structural, morphological, optical and electrical properties of the films was investigated. The X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) studies showed that all the films exhibited polycrystalline nature with β-MnS structure and were covered well on glass substrates. The bandgap and resistivity values of the films decreased from 3.39 eV to 2.92 eV and from 11.84 × 106 to 2.21 × 105 Ω-cm as the film thickness increased from 180 to 350 nm, respectively. The refractive index (n) and dielectric constants (εo, ε∞) values were calculated. © 2016 Elsevier B.V. All rights reserved.Elsevier2016Articlehttps://rdlopen.rawdatalibrary.net/r/ebyu/14223https://doi.org/10.1016/j.cplett.2016.01.0480009-2614enChemical Physics Lettersinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/14223