2026-10-18T23:16:22Zhttps://ebyu-rdlopen.rawdatalibrary.net/oai/request

oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/143302026-10-18T20:39:24Zopenairedrivercom_ebyu_10000col_ebyu_10001

X- and gamma-ray irradiation effects on vanadium pentoxide thin filmsYılmaz, DemetGüzeldir, BetülAkkuş, TubaÖznülüer, TubaGamma raythin filmvanadium pentoxideX-rayThickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium Kα X-rays and 59.54 keV gamma-rays emitted from 100 mCi and 5 Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays. © 2018, © 2018 Taylor & Francis.Taylor and Francis Inc.2018Articlehttps://rdlopen.rawdatalibrary.net/r/ebyu/14330https://doi.org/10.1080/00387010.2018.14753970038-7010enSpectroscopy Lettersinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/14330