2026-10-18T23:15:17Zhttps://ebyu-rdlopen.rawdatalibrary.net/oai/request

oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/149282026-10-18T20:29:43Zopenairedrivercom_ebyu_10000col_ebyu_10001

NH3 sensing properties of nanostructure ZnO thin film prepared by silar methodÇorlu, TugbaKaraduman, IrmakYildirim, Memet AliAtes, AytunçAcar, SelimAmmoniaGas sensorSILAR methodChemical sensorsFilm preparationGas detectorsMetallic filmsNanostructuresOptical filmsScanning electron microscopyTemperatureZinc oxideGas sensing characteristicsMorphological characterizationNanostructured ZnOOperating temperatureSensing characteristicsSuccessive ionic layer adsorption and reactionsX ray diffractometersThin filmsAmmonia (NH3) sensing characteristics of nanostructure ZnO thin film prepared by Successive Ionic Layer Adsorption and Reaction (SILAR) method are discussed in this paper. The structural and morphological characterizations of the film are performed by X-ray diffractometer (XRD) and Scanning Electron Microscope (SEM). The gas sensing characteristics have been studied by exposing the film to various concentrations of NH3 at different operating temperatures within the range of 37-77°C. The nanostructured ZnO thin film has exhibited maximum gas response to 100 ppm NH3 gas exposure at 77°C operating temperature. © 2017 Old City Publishing, Inc.Old City Publishing2017Conference Objecthttps://rdlopen.rawdatalibrary.net/r/ebyu/149280018-1544enHigh Temperatures - High Pressuresinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/conferenceObjecthttps://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/14928