2026-10-18T23:53:57Zhttps://ebyu-rdlopen.rawdatalibrary.net/oai/request

oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/157482026-10-18T20:41:31Zopenairedrivercom_ebyu_10000col_ebyu_10001

Zinc concentration effect on structural, optical and electrical properties of Cd 1-xZn xSe thin filmsAkaltun, YunusYildirim, M. AliAteş, AytunçYildirim, MuhammetA. ChalcogenidesB. Chemical synthesisD. Dielectric propertiesD. Optical propertiesAdsorptionChalcogenidesDielectric propertiesEnergy gapRefractive indexScanning electron microscopySemiconducting selenium compoundsSubstratesThin filmsVapor depositionX ray diffractionAmbient pressuresBowing parametersChemical synthesisElectron effective massEnergy bandgapsEnergy dispersive x-rayGlass substratesHigh-frequency dielectricsOptical and electrical propertiesPolycrystallineResistivity valuesRoom temperatureSuccessive ionic layer adsorption and reactionsZinc concentrationZincCd 1-xZn xSe thin films with different compositions (x = 0.0, 0.2, 0.4, 0.6, 0.8 and 1.0) were deposited on glass substrates using successive ionic layer adsorption and reaction (SILAR) method at room temperature and ambient pressure. The zinc concentration (x) effect on the structural, morphological, optical and electrical properties of Cd 1-xZn xSe thin films were investigated. The X-ray diffraction (XRD) and scanning electron microscopy (SEM) studies showed that all the films exhibited polycrystalline nature and were covered well on glass substrates. The energy dispersive X-ray (EDAX) analysis confirmed nearly stoichiometric deposition of the films. The energy bandgap values were changed from 1.99 to 2.82 eV depending on the zinc concentration. Bowing parameter was calculated as 0.08 eV. The electron effective mass (m e*/m o), refractive index (n), optical static and high frequency dielectric constants (ε o, ε ∞) values were calculated by using the energy bandgap values as a function of the zinc concentration. The resistivity values of the films changed between 10 5 and 10 7 Ω cm with increasing zinc concentration at room temperature. © 2012 Elsevier Ltd. All rights reserved.PERGAMON-ELSEVIER SCIENCE LTD2012Articlehttps://rdlopen.rawdatalibrary.net/r/ebyu/15748https://doi.org/10.1016/j.materresbull.2012.07.0180025-5408enMaterials Research Bulletininfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/15748