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Emission probabilities of K X- and γ-rays following 51Cr and 67Ga decayYalçin, P.Kurucu, Y.γ-rays emission probabilities23.20.Lv⁵¹Cr⁶⁷GaElectron capture processesX-rays emission probabilitiesDetectorsSemiconducting galliumSemiconducting siliconchromium 51gallium 67lithiumsiliconarticlecalibrationelectron capture detectiongamma radiationmathematical computingpriority journalradioisotope decaysemiconductorstandardX rayEmission probabilitiesEnergy rangePhotopeak efficiencyGamma raysEmission probabilities of K X- and γ-rays following the decay of 51Cr and 67Ga were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4-400keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values. © 2004 Elsevier Ltd. All rights reserved.2005Articlehttps://rdlopen.rawdatalibrary.net/r/ebyu/16014https://doi.org/10.1016/j.apradiso.2004.05.0780969-8043enApplied Radiation and Isotopesinfo:eu-repo/semantics/openAccessinfo:eu-repo/semantics/articlehttps://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/16014