<?xml version="1.0" encoding="UTF-8"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-10-19T01:02:08Z</responseDate><request verb="GetRecord" identifier="oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/16016" metadataPrefix="oai_dc">https://ebyu-rdlopen.rawdatalibrary.net/oai/request</request><GetRecord><record><header><identifier>oai:ebyu-rdlopen.rawdatalibrary.net:ebyu/16016</identifier><datestamp>2026-10-18T20:43:14Z</datestamp><setSpec>openaire</setSpec><setSpec>driver</setSpec><setSpec>com_ebyu_10000</setSpec><setSpec>col_ebyu_10001</setSpec></header><metadata><oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><dc:title>A microwave method for unique and non-ambiguous permittivity determination of liquid materials from measured uncalibrated scattering parameters</dc:title><dc:creator>Hasar, U.C.</dc:creator><dc:creator>Simsek, O.</dc:creator><dc:creator>Zateroglu, M.K.</dc:creator><dc:creator>Ekinci, A.E.</dc:creator><dc:subject>Liquids</dc:subject><dc:subject>Permittivity</dc:subject><dc:subject>Complex permittivity determination</dc:subject><dc:subject>Complex scattering parameters</dc:subject><dc:subject>Independent measurement</dc:subject><dc:subject>Liquid materials</dc:subject><dc:subject>Measurement configuration</dc:subject><dc:subject>Measurements of</dc:subject><dc:subject>Microwave methods</dc:subject><dc:subject>Reference data</dc:subject><dc:subject>Scattering parameters</dc:subject><dc:description>A new microwave method based on calibration-independent measurements has been proposed for non-ambiguous complex permittivity determination of liquid materials. We have derived a function in terms of the first-reflection coefficient of the sample using raw complex scattering parameter measurements of three measurement configurations. We have verified the proposed method from measurements of two liquid test samples with the available reference data in the literature.</dc:description><dc:publisher>Electromagnetics Academy</dc:publisher><dc:date>2009</dc:date><dc:type>Article</dc:type><dc:identifier>https://rdlopen.rawdatalibrary.net/r/ebyu/16016</dc:identifier><dc:identifier>https://doi.org/10.2528/pier09061401</dc:identifier><dc:identifier>1070-4698</dc:identifier><dc:language>en</dc:language><dc:relation>Progress in Electromagnetics Research</dc:relation><dc:rights>info:eu-repo/semantics/openAccess</dc:rights><dc:type>info:eu-repo/semantics/article</dc:type><dc:identifier>https://ebyu-rdlopen.rawdatalibrary.net/tr/items/ebyu/16016</dc:identifier></oai_dc:dc></metadata></record></GetRecord></OAI-PMH>