The effect of doping and annealing on the nonlinear absorption characteristics in hydrothermally grown Al doped ZnO thin films

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The effects of annealing and Al dopant on the nonlinear absorption characteristics of amorphous ZnO thin films were studied experimentally and theoretically. The structural patterns of AZO thin films grown at various growth temperatures (80ᵒC, 90ᵒC, 100ᵒC) and Al doping ratios (%5, %10, %20) were determined by using x-ray diffraction. The results revealed that the crystallinity increased with increasing growth temperature and Al doping ratio. The optical band gap decreased from 3.91 to 3.78 eV and the transmittance of AZO thin films decreased from 90% to 55% with increasing Al molar ratio. The open aperture Gaussian beam Z-scan measurements indicated that all studied films exhibited nonlinear absorption behavior due to the defect states inside energy bandgap. The nonlinear absorption coefficients increased from 1.34 × 10−4 to 6.12 × 10−4 cm/W for 4 ns pulse duration with increasing of doping concentration. The experimental curves were fitted to the theory of open aperture Gaussian beam Z-scan based on the Adomian decomposition method to obtain nonlinear absorption coefficients along with saturation intensity thresholds. In order to investigate the effect of free carrier absorption, the OA Z-scan experiments were also performed for 65 ps pulse duration. The nonlinear absorption coefficients were found to be 0.58 × 10−4, 1.81 × 10−4 and 3.29 × 10−4 cm/W for 65 ps pulse duration. For nanosecond pulse durations, the obtained nonlinear absorption coefficient values of thin films are bigger than the values of picosecond pulse durations due to the greater contribution of free carrier absorption. Increasing annealing temperature from 100ᵒC to 400ᵒC leads to decreasing nonlinear absorption coefficients owing to decreasing localized defect states. © 2019

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AlanDeğerDil
dc.contributor.authorPepe, Yasemin
dc.contributor.authorYildirim, Mehmet Ali
dc.contributor.authorKaratay, Ahmet
dc.contributor.authorAtes, Aytunc
dc.contributor.authorUnver, Huseyin
dc.contributor.authorElmali, Ayhan
dc.date.accessioned2026-10-18T20:28:40.085467197Z
dc.date.available2026-10-18T20:28:40.085467197Z
dc.date.issued2019
dc.description.abstractThe effects of annealing and Al dopant on the nonlinear absorption characteristics of amorphous ZnO thin films were studied experimentally and theoretically. The structural patterns of AZO thin films grown at various growth temperatures (80ᵒC, 90ᵒC, 100ᵒC) and Al doping ratios (%5, %10, %20) were determined by using x-ray diffraction. The results revealed that the crystallinity increased with increasing growth temperature and Al doping ratio. The optical band gap decreased from 3.91 to 3.78 eV and the transmittance of AZO thin films decreased from 90% to 55% with increasing Al molar ratio. The open aperture Gaussian beam Z-scan measurements indicated that all studied films exhibited nonlinear absorption behavior due to the defect states inside energy bandgap. The nonlinear absorption coefficients increased from 1.34 × 10−4 to 6.12 × 10−4 cm/W for 4 ns pulse duration with increasing of doping concentration. The experimental curves were fitted to the theory of open aperture Gaussian beam Z-scan based on the Adomian decomposition method to obtain nonlinear absorption coefficients along with saturation intensity thresholds. In order to investigate the effect of free carrier absorption, the OA Z-scan experiments were also performed for 65 ps pulse duration. The nonlinear absorption coefficients were found to be 0.58 × 10−4, 1.81 × 10−4 and 3.29 × 10−4 cm/W for 65 ps pulse duration. For nanosecond pulse durations, the obtained nonlinear absorption coefficient values of thin films are bigger than the values of picosecond pulse durations due to the greater contribution of free carrier absorption. Increasing annealing temperature from 100ᵒC to 400ᵒC leads to decreasing nonlinear absorption coefficients owing to decreasing localized defect states. © 2019
dc.identifier.doi10.1016/j.optmat.2019.109495
dc.identifier.eissn1873-1252
dc.identifier.issn0925-3467
dc.identifier.scopus2-s2.0-85075349221
dc.identifier.startpage109495
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/13865
dc.identifier.volume98
dc.identifier.wosWOS:000505108100073
dc.language.isoen
dc.publisherElsevier B.V.
dc.relation.ispartofOptical Materials
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectAl doped ZnO
dc.subjectAmorphous semiconductor
dc.subjectDefect states
dc.subjectHydrothermal grown
dc.subjectNonlinear absorption
dc.subjectAluminum
dc.subjectAmorphous semiconductors
dc.subjectAnnealing
dc.subjectCrystallinity
dc.subjectDefects
dc.subjectEnergy gap
dc.subjectGaussian beams
dc.subjectGrowth temperature
dc.subjectII-VI semiconductors
dc.subjectMagnetic semiconductors
dc.subjectMetallic films
dc.subjectMolar ratio
dc.subjectOptical films
dc.subjectSemiconductor doping
dc.subjectWide band gap semiconductors
dc.subjectZinc oxide
dc.subjectAdomian Decomposition Method
dc.subjectAl doped ZnO thin films
dc.subjectAl-doped ZnO
dc.subjectDefect state
dc.subjectFree carrier absorption
dc.subjectNonlinear absorption coefficient
dc.subjectNonlinear absorptions
dc.subjectThin films
dc.titleThe effect of doping and annealing on the nonlinear absorption characteristics in hydrothermally grown Al doped ZnO thin films
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus42
rdl.citation.wos45
rdl.oa.statusgreen
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)