Effect of Doping Materials on the Low-Level NO Gas Sensing Properties of ZnO Thin Films

ArticleAçık Erişim

Özet

In this study, undoped, Cu-doped, and Ni-doped ZnO thin films have been successfully prepared by successive ionic layer adsorption and reaction method. The structural, compositional, and morphological properties of the thin films are characterized by x-ray diffractometer, energy dispersive x-ray analysis (EDX), and scanning electron microscopy, respectively. Doping effects on the NO gas sensing properties of these thin films were investigated depending on gas concentration and operating temperature. Cu-doped ZnO thin film exhibited a higher gas response than undoped and Ni-doped ZnO thin film at the operating temperature range. The sensor with Cu-doped ZnO thin film gave faster responses and recovery speeds than other sensors, so that is significant for the convenient application of gas sensor. The response and recovery speeds could be associated with the effective electron transfer between the Cu-doped ZnO and the NO molecules. © 2017, The Minerals, Metals & Materials Society.

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RDL Kalıcı Bağlantı (PID)
https://rdlopen.rawdatalibrary.net/r/ebyu/14853Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1007/s11664-017-5503-zYayıncı resmi DOI adresi
Tam Kayıt
AlanDeğerDil
dc.contributor.authorÇorlu, Tugba
dc.contributor.authorKaraduman, Irmak
dc.contributor.authorYildirim, Memet Ali
dc.contributor.authorAteş, Aytunç
dc.contributor.authorAcar, Selim
dc.date.accessioned2026-10-18T20:29:39.096884716Z
dc.date.available2026-10-18T20:29:39.096884716Z
dc.date.issued2017
dc.description.abstractIn this study, undoped, Cu-doped, and Ni-doped ZnO thin films have been successfully prepared by successive ionic layer adsorption and reaction method. The structural, compositional, and morphological properties of the thin films are characterized by x-ray diffractometer, energy dispersive x-ray analysis (EDX), and scanning electron microscopy, respectively. Doping effects on the NO gas sensing properties of these thin films were investigated depending on gas concentration and operating temperature. Cu-doped ZnO thin film exhibited a higher gas response than undoped and Ni-doped ZnO thin film at the operating temperature range. The sensor with Cu-doped ZnO thin film gave faster responses and recovery speeds than other sensors, so that is significant for the convenient application of gas sensor. The response and recovery speeds could be associated with the effective electron transfer between the Cu-doped ZnO and the NO molecules. © 2017, The Minerals, Metals & Materials Society.
dc.description.sponsorshipThis work is supported by TUBITAK Project No: 115M658 and Gazi University Scientific Research Fund Project No: 05/2015-09.
dc.identifier.doi10.1007/s11664-017-5503-z
dc.identifier.eissn1543-186X
dc.identifier.endpage4002
dc.identifier.issn0361-5235
dc.identifier.issue7
dc.identifier.scopus2-s2.0-85018484416
dc.identifier.startpage3995
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/14853
dc.identifier.volume46
dc.identifier.wosWOS:000403016800029
dc.language.isoen
dc.publisherSpringer New York LLC
dc.relation.ispartofJournal of Electronic Materials
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectcopper
dc.subjectGas sensor
dc.subjectnickel
dc.subjectSILAR method
dc.subjectChemical detection
dc.subjectChemical sensors
dc.subjectEnergy dispersive X ray analysis
dc.subjectFilms
dc.subjectGas detectors
dc.subjectGases
dc.subjectMetallic films
dc.subjectOptical films
dc.subjectScanning electron microscopy
dc.subjectSemiconductor doping
dc.subjectTemperature
dc.subjectX ray analysis
dc.subjectZinc oxide
dc.subjectEnergy dispersive x-ray analysis (EDX)
dc.subjectMorphological properties
dc.subjectNi-doped zno thin films
dc.subjectOperating temperature
dc.subjectOperating temperature ranges
dc.subjectSuccessive ionic layer adsorption and reactions
dc.subjectX ray diffractometers
dc.subjectThin films
dc.titleEffect of Doping Materials on the Low-Level NO Gas Sensing Properties of ZnO Thin Films
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus26
rdl.citation.wos22
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)