The Effect of Solution Concentration and Thickness on the CuO Thin Film Grown with SILAR Technique

When thin film growth with SILAR technique is compared with other chemical techniques; more attractive, cheaper, simpler and less time consuming is preferred.The most important advantage of this technique is that some parameters such as time, thickness, number of immersion, solution concentration, temperature and pH of solution can be easily controlled during growth. In this study, the solution concentration was taken into consideration and CuO thin films were grown on the glass surface by using SILAR technique at different solution concentrations and different numbers of immersion. The structural and optical properties of the obtained CuO thin films were investigated according to the solution concentration and the number of immersion. X-Ray diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray (EDAX) were used for structural analysis and UV-vis spectrometer for optical analysis. The XRD data revealed that the films were crystallized in nano-size and that the quality of the crystallisation varied depending on the concentration of the solution.