Bu dergideki yayınlar

3 →
  • ArticleYalnız künye2020
    Synthesis of copper-doped nickel oxide thin films: Structural and optical studies

    ÇAYIR TAŞDEMİRCİ, Tuba

    The preparation of nanostructured undoped and Cu doped NiO thin films on to amorphous glass substrate via successive ionic layer absorption and reaction (SILAR) is debated. The optical and structural properties of the nanostructure undoped and Cu doped NiO thin films were studied. The characterization techniques such as UV–visible spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy were used to investigate undoped and Cu doped NiO thin films. Because of UV–Vis analysis of undoped and Cu doped NiO thin films, the optical band gap value decreased from 3.34 to 2.01 eV with the increase of Cu concentration. As a result of SEM analysis, it was seen that the nanostructures formed when the NiO thin film was enlarged changed its shape as the Cu concentration increased. In the results of AFM analysis, it was observed that copper coated on the surface began to decrease on surface roughness.

    RDL Kalıcı Kaydıİncele
  • ArticleYalnız künye2016
    Chemically synthesis and characterization of MnS thin films by SILAR method

    Yildirim, M. Ali; Yildirim, Sümeyra Tuna; Cavanmirza, Ilke; Ateş, Aytunç

    MnS thin films were synthesized on glass substrates using SILAR method. The film thickness effect on structural, morphological, optical and electrical properties of the films was investigated. The X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM) studies showed that all the films exhibited polycrystalline nature with β-MnS structure and were covered well on glass substrates. The bandgap and resistivity values of the films decreased from 3.39 eV to 2.92 eV and from 11.84 × 106 to 2.21 × 105 Ω-cm as the film thickness increased from 180 to 350 nm, respectively. The refractive index (n) and dielectric constants (εo, ε∞) values were calculated.

    RDL Kalıcı Kaydıİncele
  • ArticleYalnız künye2011
    Influence of the chemical environment changes on the line shape and intensity ratio values for La, Ce and Pr L lines spectra

    Porikli, Sevil

    We measured the energy shifts and relative intensities of Lα, Lβ and Lγ components in 26 elements under identical conditions using Si(Li) detector and 241Am as the source of excitation. The purpose of these measurements was to characterize the dependence of the line position and line width with the chemical environment changes. The spectra were fitted by Gaussian functions and the background was removed from the experimental spectra using a polynomial function. The present intensity ratio values are in good agreement with the data of Scofield [1]. The values measured by Erturul [2] show a similar behavior but somewhat higher.

    RDL Kalıcı Kaydıİncele
Tam Kayıt
AlanDeğerDil
creativeworkseries.issn0009-2614
creativeworkseries.issn1873-4448
dc.date.accessioned2026-10-20T15:40:19.125330612Z
dc.date.available2026-10-20T15:40:19.125330612Z
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/24533
dc.publisherElsevier B.V.
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleChemical Physics Letters
dspace.entity.typeJournal