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The effect of enhancement factor on the angular dependence of L x-ray intensity ratios for Sm, Hf, Pb and U

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The effect of enhancement factor on the angular dependence of Ll/Lγ, Lα/Lγ and Lβ/Lγ X-ray intensity ratios for Sm, Hf, Pb and U elements have been measured by using the 59.54 keV photon energy. The binary systems are prepared as Sm-CeO2, Hf-CeO2, Pb–CeO2 and U–CeO2. The samples have been analyzed in EDXRF system. The measurements are made in scattering angles of 85°, 95°, 105°, 115° and 125°. The L X-ray spectra from different samples were detected by a Si(Li) detector. The results show that the intensity ratios of L X-rays to be greater than expected due to the enhancement effect. © 2019 Elsevier Ltd

Anahtar Kelimeler

Angular dependenceEnhancement factorL X-raysCerium oxideEnergy dispersive spectroscopyX rayshafniumleadsamariumuraniumBinary systemsEnhancement effectsIntensity ratioScattering anglesX-ray intensity ratiosArticlefluorescencegamma radiationgeometryphotonradiation scatteringradiological parametersX rayX ray detectors
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AlanDeğerDil
dc.contributor.authorAkkuş, Tuba
dc.contributor.authorYılmaz, Demet
dc.contributor.authorUğurlu, Mine
dc.date.accessioned2026-10-18T20:28:37.693075427Z
dc.date.available2026-10-18T20:28:37.693075427Z
dc.date.issued2020
dc.description.abstractThe effect of enhancement factor on the angular dependence of Ll/Lγ, Lα/Lγ and Lβ/Lγ X-ray intensity ratios for Sm, Hf, Pb and U elements have been measured by using the 59.54 keV photon energy. The binary systems are prepared as Sm-CeO2, Hf-CeO2, Pb–CeO2 and U–CeO2. The samples have been analyzed in EDXRF system. The measurements are made in scattering angles of 85°, 95°, 105°, 115° and 125°. The L X-ray spectra from different samples were detected by a Si(Li) detector. The results show that the intensity ratios of L X-rays to be greater than expected due to the enhancement effect. © 2019 Elsevier Ltd
dc.identifier.doi10.1016/j.radphyschem.2019.108499
dc.identifier.eissn1879-0895
dc.identifier.issn0969-806X
dc.identifier.scopus2-s2.0-85072680684
dc.identifier.startpage108499
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/13819
dc.identifier.volume166
dc.identifier.wosWOS:000501394400025
dc.language.isoen
dc.publisherElsevier Ltd
dc.relation.ispartofRadiation Physics and Chemistry
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectAngular dependence
dc.subjectEnhancement factor
dc.subjectL X-rays
dc.subjectCerium oxide
dc.subjectEnergy dispersive spectroscopy
dc.subjectX rays
dc.subjecthafnium
dc.subjectlead
dc.subjectsamarium
dc.subjecturanium
dc.subjectBinary systems
dc.subjectEnhancement effects
dc.subjectIntensity ratio
dc.subjectScattering angles
dc.subjectX-ray intensity ratios
dc.subjectArticle
dc.subjectfluorescence
dc.subjectgamma radiation
dc.subjectgeometry
dc.subjectphoton
dc.subjectradiation scattering
dc.subjectradiological parameters
dc.subjectX ray
dc.subjectX ray detectors
dc.titleThe effect of enhancement factor on the angular dependence of L x-ray intensity ratios for Sm, Hf, Pb and U
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus0
rdl.citation.wos0
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)