Effect of mechanical noise upon X-ray fluorescence analysis

The effect of the external mechanical noise on energy dispersive X-ray fluorescence (EDXRF) spectra has been investigated. A Nd2O3 sample was bombarded by the gamma-rays of 59.54 keV energy. The annular radioactive source (americium-241) with intensity equal to 1 Curie was used. The intensities of characteristic x-rays emitted from the Nd2O3 sample were measured using a high purity germanium detector. The mechanical noise applied to the experimental system had intensity values of 50 dB, 60 dB, 70 dB, 80 dB, 90 dB, and 100 dB. A sound level meter (Model 8928) was used to measure the external mechanical noise levels. The net area (P), background intensity (B), peak-to-background ratio (P/B), and full width at half-maximum (FWHM) of the characteristic peaks were determined in the energy dispersive X-ray fluorescence spectra obtained from Nd2O3 sample. It was observed that the background intensities of Kα and Kβ peaks of the sample increased with the increasing mechanical noise level. The peak-to-background ratios (P/B) and the peak resolution decreased with increasing mechanical noise level. © 2019, © 2019 Taylor & Francis Group, LLC.