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Emission probabilities of K X- and γ-rays following 51Cr and 67Ga decay

ArticleAçık Erişim

Özet

Emission probabilities of K X- and γ-rays following the decay of 51Cr and 67Ga were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4-400keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values. © 2004 Elsevier Ltd. All rights reserved.

Anahtar Kelimeler

γ-rays emission probabilities23.20.Lv<sup>51</sup>Cr<sup>67</sup>GaElectron capture processesX-rays emission probabilitiesDetectorsSemiconducting galliumSemiconducting siliconchromium 51gallium 67lithiumsiliconarticlecalibrationelectron capture detectiongamma radiationmathematical computingpriority journalradioisotope decaysemiconductorstandardX rayEmission probabilitiesEnergy rangePhotopeak efficiencyGamma rays
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Tam Kayıt
AlanDeğerDil
dc.contributor.authorYalçin, P.
dc.contributor.authorKurucu, Y.
dc.date.accessioned2026-10-18T20:30:51.306703773Z
dc.date.available2026-10-18T20:30:51.306703773Z
dc.date.issued2005
dc.description.abstractEmission probabilities of K X- and γ-rays following the decay of 51Cr and 67Ga were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4-400keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values. © 2004 Elsevier Ltd. All rights reserved.
dc.identifier.doi10.1016/j.apradiso.2004.05.078
dc.identifier.endpage67
dc.identifier.issn0969-8043
dc.identifier.issue1
dc.identifier.scopus2-s2.0-7444244323
dc.identifier.startpage63
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/16014
dc.identifier.volume62
dc.language.isoen
dc.relation.ispartofApplied Radiation and Isotopes
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectγ-rays emission probabilities
dc.subject23.20.Lv
dc.subject<sup>51</sup>Cr
dc.subject<sup>67</sup>Ga
dc.subjectElectron capture processes
dc.subjectX-rays emission probabilities
dc.subjectDetectors
dc.subjectSemiconducting gallium
dc.subjectSemiconducting silicon
dc.subjectchromium 51
dc.subjectgallium 67
dc.subjectlithium
dc.subjectsilicon
dc.subjectarticle
dc.subjectcalibration
dc.subjectelectron capture detection
dc.subjectgamma radiation
dc.subjectmathematical computing
dc.subjectpriority journal
dc.subjectradioisotope decay
dc.subjectsemiconductor
dc.subjectstandard
dc.subjectX ray
dc.subjectEmission probabilities
dc.subjectEnergy range
dc.subjectPhotopeak efficiency
dc.subjectGamma rays
dc.titleEmission probabilities of K X- and γ-rays following 51Cr and 67Ga decay
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus14
rdl.source.indexSCOPUS