Analyses of Cu impurity effects on the USP grown MgO thin films: Structural, optical and photocatalytic assessments

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Unspoiled and copper (Cu) doped magnesium oxide (MgO) thin films were successfully grown via ultrasonic spray pyrolysis method on soda lime glass substrates. Aftermath of the varied impurity presence in the host material were examined by conducting scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), X-ray Diffraction (XRD), photoluminescence (PL) spectroscopy, ultraviolet–visible (UV) spectroscopy, and photocatalytic measurements. The structural observations unveiled that the grown films showed (101) plane orientations with no secondary phases such as Cu or copper oxide present. Also, the XRD data discovered that the grain size of pure MgO sample decreased owing to the fact that Cu impurities introduced into the host material lattice system. In addition to that, the SEM images revealed that the impurity addition into the MgO nanocrystallites switched molecular shapes from regular to spherical structures. Besides, the aimed elemental compositions in the synthesized thin films were verified by the XPS. Furthermore, the photocatalytic measurements uncovered that the right amount of the magnesium content in the host material can enhance and tune the photocatalytic performance of the MgO films as desired. In the optical measurements, it was observed that optical absorbance values increased in the presence of varied percentages although these increments followed a random trend in respect to the doping levels (0.5%, 1%, 2%, 4% and 8 wt.%). The PL spectra revealed that the intensity of luminescent emissions gradually decreased which can be ascribed to the imperfections as a result of the introduced Cu into MgO. © 2023

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AlanDeğerDil
dc.contributor.authorSağlam, Hilal Kübra
dc.contributor.authorİskenderoğlu, Demet
dc.contributor.authorGüldüren, Muhammed Emin
dc.contributor.authorGüney, Harun
dc.contributor.authorŞahin, Burak
dc.contributor.authorErtuğrul, Mehmet
dc.date.accessioned2026-10-18T20:26:53.430182801Z
dc.date.available2026-10-18T20:26:53.430182801Z
dc.date.issued2023
dc.description.abstractUnspoiled and copper (Cu) doped magnesium oxide (MgO) thin films were successfully grown via ultrasonic spray pyrolysis method on soda lime glass substrates. Aftermath of the varied impurity presence in the host material were examined by conducting scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), X-ray Diffraction (XRD), photoluminescence (PL) spectroscopy, ultraviolet–visible (UV) spectroscopy, and photocatalytic measurements. The structural observations unveiled that the grown films showed (101) plane orientations with no secondary phases such as Cu or copper oxide present. Also, the XRD data discovered that the grain size of pure MgO sample decreased owing to the fact that Cu impurities introduced into the host material lattice system. In addition to that, the SEM images revealed that the impurity addition into the MgO nanocrystallites switched molecular shapes from regular to spherical structures. Besides, the aimed elemental compositions in the synthesized thin films were verified by the XPS. Furthermore, the photocatalytic measurements uncovered that the right amount of the magnesium content in the host material can enhance and tune the photocatalytic performance of the MgO films as desired. In the optical measurements, it was observed that optical absorbance values increased in the presence of varied percentages although these increments followed a random trend in respect to the doping levels (0.5%, 1%, 2%, 4% and 8 wt.%). The PL spectra revealed that the intensity of luminescent emissions gradually decreased which can be ascribed to the imperfections as a result of the introduced Cu into MgO. © 2023
dc.description.sponsorshipThe authors thank Atatürk University for financial support of the study (Project no: FKP-2022-10375).
dc.identifier.doi10.1016/j.optmat.2023.114499
dc.identifier.issn0925-3467
dc.identifier.scopus2-s2.0-85174441270
dc.identifier.startpage114499
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/11908
dc.identifier.volume145
dc.language.isoen
dc.publisherElsevier B.V.
dc.relation.ispartofOptical Materials
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectMgO thin films
dc.subjectPhotocatalysis
dc.subjectUSP
dc.subjectXPS
dc.subjectXRD
dc.subjectCopper oxides
dc.subjectGlass substrates
dc.subjectLime
dc.subjectMagnesia
dc.subjectOptical data processing
dc.subjectOxide films
dc.subjectPhotoluminescence spectroscopy
dc.subjectScanning electron microscopy
dc.subjectSemiconductor doping
dc.subjectSpray pyrolysis
dc.subjectThin films
dc.subjectX ray photoelectron spectroscopy
dc.subjectCu impurity
dc.subjectHost materials
dc.subjectImpurity effect
dc.subjectMagnesium oxide thin film
dc.subjectOptical-
dc.subjectOxide thin films
dc.subjectPhoto-catalytic
dc.subjectThin-films
dc.subjectX- ray diffractions
dc.subjectX ray diffraction
dc.titleAnalyses of Cu impurity effects on the USP grown MgO thin films: Structural, optical and photocatalytic assessments
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus4
rdl.source.indexSCOPUS