Variation of scattering intensity ratios with mean atomic number using a dilution technique in EDXRF

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The variation of different intensity ratios with mean atomic number for qualitative analysis was investigated in EDXRF. Ten different samples with a mean atomic number between 4.268 and 5.786 were obtained by mixing zirconyl chloride octahydrate (Cl 2 OZr·8H 2 O) and cellulose (C 6 H 10 O 5 ) powders. The samples were excited by 59.54 keV gamma rays emitted from a 241 Am annular radioactive source with 5 Ci activity. The high purity germanium (HPGe) semiconductor detector with a resolution of 182 eV at 5.9 keV was used to detect the photons. (I coh /2(μ/ρ) λ +I comp /(μ/ρ) λ +(μ/ρ) λ−Δλ ), (I coh +I Comp )/(μ/ρ) λ , (I coh /2(μ/ρ) λ , I Kα /I sc and I Kβ /I sc intensity ratios in XRF spectrum for the assessment of information regarding the mean atomic number of the samples are studied. It has been observed that the total scattering intensity ratios can be used with high reliability in qualitative analysis for complex materials. © 2018 Elsevier Ltd

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AlanDeğerDil
dc.contributor.authorAkkuş, Tuba
dc.contributor.authorUzunoğlu, Zeynep
dc.contributor.authorYılmaz, Demet
dc.date.accessioned2026-10-18T20:28:33.005217129Z
dc.date.available2026-10-18T20:28:33.005217129Z
dc.date.issued2019
dc.description.abstractThe variation of different intensity ratios with mean atomic number for qualitative analysis was investigated in EDXRF. Ten different samples with a mean atomic number between 4.268 and 5.786 were obtained by mixing zirconyl chloride octahydrate (Cl 2 OZr·8H 2 O) and cellulose (C 6 H 10 O 5 ) powders. The samples were excited by 59.54 keV gamma rays emitted from a 241 Am annular radioactive source with 5 Ci activity. The high purity germanium (HPGe) semiconductor detector with a resolution of 182 eV at 5.9 keV was used to detect the photons. (I coh /2(μ/ρ) λ +I comp /(μ/ρ) λ +(μ/ρ) λ−Δλ ), (I coh +I Comp )/(μ/ρ) λ , (I coh /2(μ/ρ) λ , I Kα /I sc and I Kβ /I sc intensity ratios in XRF spectrum for the assessment of information regarding the mean atomic number of the samples are studied. It has been observed that the total scattering intensity ratios can be used with high reliability in qualitative analysis for complex materials. © 2018 Elsevier Ltd
dc.identifier.doi10.1016/j.apradiso.2018.11.010
dc.identifier.eissn1872-9800
dc.identifier.endpage11
dc.identifier.issn0969-8043
dc.identifier.pmid30557772
dc.identifier.scopus2-s2.0-85058434030
dc.identifier.startpage7
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/13725
dc.identifier.volume145
dc.identifier.wosWOS:000461407300002
dc.language.isoen
dc.publisherElsevier Ltd
dc.relation.ispartofApplied Radiation and Isotopes
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectEDXRF
dc.subjectIntensity ratio
dc.subjectMean atomic number
dc.subjectQualitative analysis
dc.subjectChlorine Compounds
dc.subjectGamma Rays
dc.subjectGermanium Compounds
dc.subjectPhosphorus Compounds
dc.subjectRadioactivity
dc.subjectZirconium Compounds
dc.subjectEnergy dispersive spectroscopy
dc.subjectReliability analysis
dc.subjectSemiconducting germanium compounds
dc.subjectSemiconductor detectors
dc.subjectamericium 241
dc.subjectcellulose
dc.subjectchemical compound
dc.subjectgermanium
dc.subjectunclassified drug
dc.subjectzirconyl chloride octahydrate
dc.subjectAtomic numbers
dc.subjectDilution technique
dc.subjectHigh purity germaniums
dc.subjectRadioactive sources
dc.subjectScattering intensity
dc.subjectArticle
dc.subjectcorrelational study
dc.subjectdilution
dc.subjectenergy dispersive X ray fluorescence spectroscopy
dc.subjectgamma radiation
dc.titleVariation of scattering intensity ratios with mean atomic number using a dilution technique in EDXRF
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus5
rdl.citation.wos6
rdl.departmentDepartment of Physics, Faculty of Arts and Sciences, Erzincan Binali Yıldırım University, Erzincan 24100, Turkey. Electronic address: takkus@erzincan.edu.tr.
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.source.indexPUBMED
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)