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X- and gamma-ray irradiation effects on vanadium pentoxide thin films

ArticleAçık Erişim

Özet

Thickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium Kα X-rays and 59.54 keV gamma-rays emitted from 100 mCi and 5 Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays. © 2018, © 2018 Taylor & Francis.

Anahtar Kelimeler

Gamma raythin filmvanadium pentoxideX-ray
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Tam Kayıt
AlanDeğerDil
dc.contributor.authorYılmaz, Demet
dc.contributor.authorGüzeldir, Betül
dc.contributor.authorAkkuş, Tuba
dc.contributor.authorÖznülüer, Tuba
dc.date.accessioned2026-10-18T20:29:07.960150776Z
dc.date.available2026-10-18T20:29:07.960150776Z
dc.date.issued2018
dc.description.abstractThickness and composition of thin films can be measured with X- and gamma-rays. In this work, thickness and composition of vanadium pentoxide thin films are investigated by energy dispersive and wavelength dispersive X-ray fluorescence systems. Also, the surface analysis of vanadium pentoxide thin films irradiated with Rhodium Kα X-rays and 59.54 keV gamma-rays emitted from 100 mCi and 5 Ci Americium-241 radioactive sources is performed by scanning electron microscope. It is observed that X- and gamma-rays are destructive for vanadium pentoxide thin films. Also, the composition of vanadium pentoxide thin films changes by irradiation with X- and gamma-rays. © 2018, © 2018 Taylor & Francis.
dc.identifier.doi10.1080/00387010.2018.1475397
dc.identifier.eissn1532-2289
dc.identifier.endpage301
dc.identifier.issn0038-7010
dc.identifier.issue6
dc.identifier.scopus2-s2.0-85047915577
dc.identifier.startpage297
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/14330
dc.identifier.volume51
dc.identifier.wosWOS:000444093500008
dc.language.isoen
dc.publisherTaylor and Francis Inc.
dc.relation.ispartofSpectroscopy Letters
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectGamma ray
dc.subjectthin film
dc.subjectvanadium pentoxide
dc.subjectX-ray
dc.titleX- and gamma-ray irradiation effects on vanadium pentoxide thin films
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus3
rdl.citation.wos2
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)