Synthesis of copper-doped nickel oxide thin films: Structural and optical studies

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The preparation of nanostructured undoped and Cu doped NiO thin films on to amorphous glass substrate via successive ionic layer absorption and reaction (SILAR) is debated. The optical and structural properties of the nanostructure undoped and Cu doped NiO thin films were studied. The characterization techniques such as UV–visible spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy were used to investigate undoped and Cu doped NiO thin films. Because of UV–Vis analysis of undoped and Cu doped NiO thin films, the optical band gap value decreased from 3.34 to 2.01 eV with the increase of Cu concentration. As a result of SEM analysis, it was seen that the nanostructures formed when the NiO thin film was enlarged changed its shape as the Cu concentration increased. In the results of AFM analysis, it was observed that copper coated on the surface began to decrease on surface roughness. © 2019 Elsevier B.V.

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dc.contributor.authorÇAYIR TAŞDEMİRCİ, Tuba
dc.date.accessioned2026-10-18T20:28:39.656603698Z
dc.date.available2026-10-18T20:28:39.656603698Z
dc.date.issued2020
dc.description.abstractThe preparation of nanostructured undoped and Cu doped NiO thin films on to amorphous glass substrate via successive ionic layer absorption and reaction (SILAR) is debated. The optical and structural properties of the nanostructure undoped and Cu doped NiO thin films were studied. The characterization techniques such as UV–visible spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy were used to investigate undoped and Cu doped NiO thin films. Because of UV–Vis analysis of undoped and Cu doped NiO thin films, the optical band gap value decreased from 3.34 to 2.01 eV with the increase of Cu concentration. As a result of SEM analysis, it was seen that the nanostructures formed when the NiO thin film was enlarged changed its shape as the Cu concentration increased. In the results of AFM analysis, it was observed that copper coated on the surface began to decrease on surface roughness. © 2019 Elsevier B.V.
dc.description.sponsorshipThis work has been carried out within the scope of the project of the Scientific Research Project of Erzincan Binali Yildirim University FEN-A-140613-0038.
dc.identifier.doi10.1016/j.cplett.2019.136884
dc.identifier.eissn1873-4448
dc.identifier.issn0009-2614
dc.identifier.scopus2-s2.0-85073609193
dc.identifier.startpage136884
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/13860
dc.identifier.volume738
dc.identifier.wosWOS:000501784200048
dc.language.isoen
dc.publisherElsevier B.V.
dc.relation.ispartofChemical Physics Letters
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectCu doped NiO
dc.subjectDeposition
dc.subjectSILAR method
dc.subjectThin film
dc.subjectAtomic force microscopy
dc.subjectCopper oxides
dc.subjectEnergy gap
dc.subjectFilm preparation
dc.subjectMetal coatings
dc.subjectNanostructures
dc.subjectNickel oxide
dc.subjectOxide films
dc.subjectScanning electron microscopy
dc.subjectSubstrates
dc.subjectSurface roughness
dc.subjectThin films
dc.subjectAmorphous glass
dc.subjectCharacterization techniques
dc.subjectCu concentrations
dc.subjectCu-doped
dc.subjectNano-structured
dc.subjectNickel oxide thin films
dc.subjectVisible spectroscopy
dc.subjectOptical films
dc.titleSynthesis of copper-doped nickel oxide thin films: Structural and optical studies
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus43
rdl.citation.wos32
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)