Compact and Cost-Efficient Dual-Buck NPC Inverter with Dead-Time Elimination and Shoot-Through Suppression

ArticleAçık Erişim

Özet

Dead-time insertion is the conventional method for preventing shoot-through faults in neutral-point-clamped inverters (NPCIs), but it inevitably degrades output-voltage quality, lowers efficiency, and increases control complexity due to dead-time compensation. This article presents a novel transformer-based dual-buck NPCI (T-DB-NPCI) cell that inherently solves this problem at the topology level. The proposed structure not only eliminates the need for dead-time during normal switching transitions but also provides robust hardware suppression of destructive, long-duration shoot-through faults. The proposed cell is designed to safely withstand forced shoot-through faults of up to 2 μs, ensuring high reliability without requiring complex detection algorithms. The topology features a remarkably compact structure comprising only a single high-frequency transformer and one auxiliary diode, enabling all semiconductor devices to operate at only half the DC-link voltage. Furthermore, the streamlined structure allows for the use of standard sinusoidal pulse width modulation (SPWM), significantly reducing control complexity. Comprehensive results from a 425-W prototype achieving 97.4% peak experimental efficiency confirm excellent performance. A comparative analysis reveals an 8% improvement in power density (683 W/kg) and a 6% cost advantage over its closest counterpart. The T-DB-NPCI topology emerges as a highly promising solution where reliability and simplicity are critical. © 1982-2012 IEEE.

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RDL Kalıcı Bağlantı (PID)
https://rdlopen.rawdatalibrary.net/r/ebyu/10501Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1109/tie.2026.3672863Yayıncı resmi DOI adresi
Tam Kayıt
AlanDeğerDil
dc.contributor.authorSahin, Yakup
dc.contributor.authorBlaabjerg, Frede
dc.contributor.authorHatas, Hasan
dc.contributor.authorTing, Naim Suleyman
dc.contributor.authorBakan, Ahmet Faruk
dc.contributor.authorAhmed, Md Rishad
dc.date.accessioned2026-10-18T20:25:42.476052698Z
dc.date.available2026-10-18T20:25:42.476052698Z
dc.date.issued2026
dc.description.abstractDead-time insertion is the conventional method for preventing shoot-through faults in neutral-point-clamped inverters (NPCIs), but it inevitably degrades output-voltage quality, lowers efficiency, and increases control complexity due to dead-time compensation. This article presents a novel transformer-based dual-buck NPCI (T-DB-NPCI) cell that inherently solves this problem at the topology level. The proposed structure not only eliminates the need for dead-time during normal switching transitions but also provides robust hardware suppression of destructive, long-duration shoot-through faults. The proposed cell is designed to safely withstand forced shoot-through faults of up to 2 μs, ensuring high reliability without requiring complex detection algorithms. The topology features a remarkably compact structure comprising only a single high-frequency transformer and one auxiliary diode, enabling all semiconductor devices to operate at only half the DC-link voltage. Furthermore, the streamlined structure allows for the use of standard sinusoidal pulse width modulation (SPWM), significantly reducing control complexity. Comprehensive results from a 425-W prototype achieving 97.4% peak experimental efficiency confirm excellent performance. A comparative analysis reveals an 8% improvement in power density (683 W/kg) and a 6% cost advantage over its closest counterpart. The T-DB-NPCI topology emerges as a highly promising solution where reliability and simplicity are critical. © 1982-2012 IEEE.
dc.description.sponsorshipReceived 10 September 2025; revised 9 December 2025 and 19 January 2026; accepted 7 February 2026. Date of publication 23 March 2026; date of current version 24 June 2026. This work was supported in part by the Scientific and Technological Research Council of Turkey (TUBITAK) under Grant 1059B192302061. (Corresponding author: Yakup Sahin.) Yakup Sahin is with the Department of Electrical and Electronic Engineering, Bitlis Eren University, Bitlis 13100, Turkey, and also with Aalborg University, 9220 Aalborg, Denmark (e-mail: ysahin@beu.edu.tr).
dc.identifier.doi10.1109/tie.2026.3672863
dc.identifier.eissn1557-9948
dc.identifier.endpage11710
dc.identifier.issn0278-0046
dc.identifier.issue8
dc.identifier.scopus2-s2.0-105034163953
dc.identifier.startpage11698
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/10501
dc.identifier.volume73
dc.identifier.wosWOS:001727470400001
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofIEEE Transactions on Industrial Electronics
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectDead-time
dc.subjectdual-buck
dc.subjectneutral-point-clamped (NPC) inverter
dc.subjectreliability
dc.subjectshoot-through
dc.subjecttransformer
dc.subjectCosts
dc.subjectEfficiency
dc.subjectElectric inverters
dc.subjectSemiconductor device structures
dc.subjectSemiconductor diodes
dc.subjectTopology
dc.subjectVoltage control
dc.subjectControl complexity
dc.subjectConventional methods
dc.subjectCost-efficient
dc.subjectDead time
dc.subjectNeutral-point clamped inverters
dc.subjectOutput voltages
dc.subjectVoltage quality
dc.titleCompact and Cost-Efficient Dual-Buck NPC Inverter with Dead-Time Elimination and Shoot-Through Suppression
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus0
rdl.citation.wos0
rdl.oa.statusgreen
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)