Compact and Cost-Efficient Dual-Buck NPC Inverter with Dead-Time Elimination and Shoot-Through Suppression
Özet
Dead-time insertion is the conventional method for preventing shoot-through faults in neutral-point-clamped inverters (NPCIs), but it inevitably degrades output-voltage quality, lowers efficiency, and increases control complexity due to dead-time compensation. This article presents a novel transformer-based dual-buck NPCI (T-DB-NPCI) cell that inherently solves this problem at the topology level. The proposed structure not only eliminates the need for dead-time during normal switching transitions but also provides robust hardware suppression of destructive, long-duration shoot-through faults. The proposed cell is designed to safely withstand forced shoot-through faults of up to 2 μs, ensuring high reliability without requiring complex detection algorithms. The topology features a remarkably compact structure comprising only a single high-frequency transformer and one auxiliary diode, enabling all semiconductor devices to operate at only half the DC-link voltage. Furthermore, the streamlined structure allows for the use of standard sinusoidal pulse width modulation (SPWM), significantly reducing control complexity. Comprehensive results from a 425-W prototype achieving 97.4% peak experimental efficiency confirm excellent performance. A comparative analysis reveals an 8% improvement in power density (683 W/kg) and a 6% cost advantage over its closest counterpart. The T-DB-NPCI topology emerges as a highly promising solution where reliability and simplicity are critical. © 1982-2012 IEEE.
Anahtar Kelimeler
Tam Kayıt
| Alan | Değer | Dil |
|---|---|---|
| dc.contributor.author | Sahin, Yakup | |
| dc.contributor.author | Blaabjerg, Frede | |
| dc.contributor.author | Hatas, Hasan | |
| dc.contributor.author | Ting, Naim Suleyman | |
| dc.contributor.author | Bakan, Ahmet Faruk | |
| dc.contributor.author | Ahmed, Md Rishad | |
| dc.date.accessioned | 2026-10-18T20:25:42.476052698Z | |
| dc.date.available | 2026-10-18T20:25:42.476052698Z | |
| dc.date.issued | 2026 | |
| dc.description.abstract | Dead-time insertion is the conventional method for preventing shoot-through faults in neutral-point-clamped inverters (NPCIs), but it inevitably degrades output-voltage quality, lowers efficiency, and increases control complexity due to dead-time compensation. This article presents a novel transformer-based dual-buck NPCI (T-DB-NPCI) cell that inherently solves this problem at the topology level. The proposed structure not only eliminates the need for dead-time during normal switching transitions but also provides robust hardware suppression of destructive, long-duration shoot-through faults. The proposed cell is designed to safely withstand forced shoot-through faults of up to 2 μs, ensuring high reliability without requiring complex detection algorithms. The topology features a remarkably compact structure comprising only a single high-frequency transformer and one auxiliary diode, enabling all semiconductor devices to operate at only half the DC-link voltage. Furthermore, the streamlined structure allows for the use of standard sinusoidal pulse width modulation (SPWM), significantly reducing control complexity. Comprehensive results from a 425-W prototype achieving 97.4% peak experimental efficiency confirm excellent performance. A comparative analysis reveals an 8% improvement in power density (683 W/kg) and a 6% cost advantage over its closest counterpart. The T-DB-NPCI topology emerges as a highly promising solution where reliability and simplicity are critical. © 1982-2012 IEEE. | |
| dc.description.sponsorship | Received 10 September 2025; revised 9 December 2025 and 19 January 2026; accepted 7 February 2026. Date of publication 23 March 2026; date of current version 24 June 2026. This work was supported in part by the Scientific and Technological Research Council of Turkey (TUBITAK) under Grant 1059B192302061. (Corresponding author: Yakup Sahin.) Yakup Sahin is with the Department of Electrical and Electronic Engineering, Bitlis Eren University, Bitlis 13100, Turkey, and also with Aalborg University, 9220 Aalborg, Denmark (e-mail: ysahin@beu.edu.tr). | |
| dc.identifier.doi | 10.1109/tie.2026.3672863 | |
| dc.identifier.eissn | 1557-9948 | |
| dc.identifier.endpage | 11710 | |
| dc.identifier.issn | 0278-0046 | |
| dc.identifier.issue | 8 | |
| dc.identifier.scopus | 2-s2.0-105034163953 | |
| dc.identifier.startpage | 11698 | |
| dc.identifier.uri | https://rdlopen.rawdatalibrary.net/r/ebyu/10501 | |
| dc.identifier.volume | 73 | |
| dc.identifier.wos | WOS:001727470400001 | |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | |
| dc.relation.ispartof | IEEE Transactions on Industrial Electronics | |
| dc.rights | info:eu-repo/semantics/openAccess | |
| dc.subject | Dead-time | |
| dc.subject | dual-buck | |
| dc.subject | neutral-point-clamped (NPC) inverter | |
| dc.subject | reliability | |
| dc.subject | shoot-through | |
| dc.subject | transformer | |
| dc.subject | Costs | |
| dc.subject | Efficiency | |
| dc.subject | Electric inverters | |
| dc.subject | Semiconductor device structures | |
| dc.subject | Semiconductor diodes | |
| dc.subject | Topology | |
| dc.subject | Voltage control | |
| dc.subject | Control complexity | |
| dc.subject | Conventional methods | |
| dc.subject | Cost-efficient | |
| dc.subject | Dead time | |
| dc.subject | Neutral-point clamped inverters | |
| dc.subject | Output voltages | |
| dc.subject | Voltage quality | |
| dc.title | Compact and Cost-Efficient Dual-Buck NPC Inverter with Dead-Time Elimination and Shoot-Through Suppression | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| rdl.citation.scopus | 0 | |
| rdl.citation.wos | 0 | |
| rdl.oa.status | green | |
| rdl.source.index | SCOPUS | |
| rdl.source.index | WOS | |
| rdl.wos.index | Science Citation Index Expanded (SCI-EXPANDED) |
