Aftermath of Ag embedding on structural, optical, and supercapacitor electrode attributes of USP-grown CuO thin films

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Here, ultrasonic spray pyrolysis method (USP) was utilized to produce pure and silver doped copper oxide nanostructures on glass substrates. Thereafter, several characterization techniques were conducted on the grown samples to delve into their morphological, structural, electrochemical, and optical aspects. The mentioned analyses were carried out by performing x-ray photoelectron spectroscopy, scanning electron microscope, X-ray diffraction, electrochemical impedance spectroscopy, galvostatic charge-discharge, cyclic voltammetry, and UV–visible spectroscopy measurements. Thus, the impact of silver impurity doping on the relevant aspects of host material were recorded as well as the features of unspoiled copper oxide films. Accordingly, the samples, as indicated by X-ray diffraction results, possessed (002) preferential plane orientation of copper oxide material along with the crystallite sizes ranging from 52.52 nm to 75.02 nm due to the imperfections caused by the silver doping. The scanning electron microscope images exhibited that the silver doping did not form significant modifications in the host material morphology where nanowire-like structures observed. The presence of the suggested materials in the films was verified by the x-ray photoelectron spectroscopy. Also, the UV–visible spectroscopy measurements detected that optical absorbance edge and bandgap energy values red shifted as a result of the impurity doping. The electrochemical supercapacitors performances of the silver doped copper oxide nanostructured thin films were inspected by using the GCD, EIS, and CV. The silver doped copper oxide films demonstrated a specific capacitance value of 66 F/g at a current density of 1 A/g in 1 M KOH electrolyte. From Nyquist plot, Rs, Rcor, Rpo, Ccor and Cc were obtained as 2.327 × 103 Ω.cm2, 43.63 × 103 Ω.cm2, 4.580 × 103 Ω.cm2, 111.5 × 10-6 S*s^a. cm-2 and 101.1 × 10-6 S*s^a. cm-2, respectively. The results indicated that the electrochemically synthesized the silver doped copper oxide electrodes can be obtained and developed as an alternative electrode material for supercapacitors (SCs). © The Author(s) 2024.

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RDL Kalıcı Bağlantı (PID)
https://rdlopen.rawdatalibrary.net/r/ebyu/11014Resmi atıflarda kullanılan kalıcı adres
DOI
https://doi.org/10.1007/s00339-024-07732-zYayıncı resmi DOI adresi
Tam Kayıt
AlanDeğerDil
dc.contributor.authorGüney, Harun
dc.contributor.authorİskenderoğlu, Demet
dc.contributor.authorGüldüren, Muhammed Emin
dc.contributor.authorDemir, Kübra Çinar
dc.contributor.authorKaradeniz, Sibel Morkoç
dc.date.accessioned2026-10-18T20:26:07.258822713Z
dc.date.available2026-10-18T20:26:07.258822713Z
dc.date.issued2024
dc.description.abstractHere, ultrasonic spray pyrolysis method (USP) was utilized to produce pure and silver doped copper oxide nanostructures on glass substrates. Thereafter, several characterization techniques were conducted on the grown samples to delve into their morphological, structural, electrochemical, and optical aspects. The mentioned analyses were carried out by performing x-ray photoelectron spectroscopy, scanning electron microscope, X-ray diffraction, electrochemical impedance spectroscopy, galvostatic charge-discharge, cyclic voltammetry, and UV–visible spectroscopy measurements. Thus, the impact of silver impurity doping on the relevant aspects of host material were recorded as well as the features of unspoiled copper oxide films. Accordingly, the samples, as indicated by X-ray diffraction results, possessed (002) preferential plane orientation of copper oxide material along with the crystallite sizes ranging from 52.52 nm to 75.02 nm due to the imperfections caused by the silver doping. The scanning electron microscope images exhibited that the silver doping did not form significant modifications in the host material morphology where nanowire-like structures observed. The presence of the suggested materials in the films was verified by the x-ray photoelectron spectroscopy. Also, the UV–visible spectroscopy measurements detected that optical absorbance edge and bandgap energy values red shifted as a result of the impurity doping. The electrochemical supercapacitors performances of the silver doped copper oxide nanostructured thin films were inspected by using the GCD, EIS, and CV. The silver doped copper oxide films demonstrated a specific capacitance value of 66 F/g at a current density of 1 A/g in 1 M KOH electrolyte. From Nyquist plot, Rs, Rcor, Rpo, Ccor and Cc were obtained as 2.327 × 103 Ω.cm2, 43.63 × 103 Ω.cm2, 4.580 × 103 Ω.cm2, 111.5 × 10-6 S*s^a. cm-2 and 101.1 × 10-6 S*s^a. cm-2, respectively. The results indicated that the electrochemically synthesized the silver doped copper oxide electrodes can be obtained and developed as an alternative electrode material for supercapacitors (SCs). © The Author(s) 2024.
dc.description.sponsorshipOpen access funding provided by the Scientific and Technological Research Council of T\u00FCrkiye (T\u00DCB\u0130TAK).
dc.identifier.doi10.1007/s00339-024-07732-z
dc.identifier.eissn1432-0630
dc.identifier.issn0947-8396
dc.identifier.issue8
dc.identifier.scopus2-s2.0-85199268345
dc.identifier.startpage580
dc.identifier.urihttps://rdlopen.rawdatalibrary.net/r/ebyu/11014
dc.identifier.volume130
dc.identifier.wosWOS:001275330100003
dc.language.isoen
dc.publisherSpringer Science and Business Media Deutschland GmbH
dc.relation.ispartofApplied Physics A: Materials Science and Processing
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectAg doped CuO
dc.subjectSupercapacitor
dc.subjectUltrasonic spray pyrolysis
dc.subjectUv-vis
dc.subjectXRD
dc.subjectCyclic voltammetry
dc.subjectElectric discharges
dc.subjectElectrochemical impedance spectroscopy
dc.subjectElectrodes
dc.subjectElectrolytes
dc.subjectGlass substrates
dc.subjectMorphology
dc.subjectOxide films
dc.subjectPhotoelectrons
dc.subjectPhotons
dc.subjectScanning electron microscopy
dc.subjectSemiconductor doping
dc.subjectThin films
dc.subjectX ray diffraction
dc.subjectX ray photoelectron spectroscopy
dc.subjectAg doped
dc.subjectDoped copper oxides
dc.subjectOptical-
dc.subjectScanning electrons
dc.subjectUltrasonic spray pyrolysis method
dc.subjectX-ray photoelectrons
dc.subjectCopper oxides
dc.titleAftermath of Ag embedding on structural, optical, and supercapacitor electrode attributes of USP-grown CuO thin films
dc.typeArticle
dspace.entity.typePublication
rdl.citation.scopus3
rdl.citation.wos3
rdl.oa.statusgold
rdl.source.indexSCOPUS
rdl.source.indexWOS
rdl.wos.indexScience Citation Index Expanded (SCI-EXPANDED)