A novel OTA-based circuit model corroborated by an experimental semiconductor memristor
Özet
A semiconductor memristor device based on a 300-nm ZnO thin film was fabricated by direct-current reactive sputter. The memristive behavior of this device was confirmed by time dependent current–voltage (I-V-t) measurements, and the distinctive pinched hysteresis I-V loops of the memristor were observed. Structural analysis of the ZnO memristor was carried out using both X-ray powder diffraction (XRD) and scanning electron microscopy (SEM). After physical implementation of the memristor, an operational transconductance amplifier (OTA) based memristor circuit was designed to emulate the ZnO-based semiconductor memristor for use in memristor-based circuit applications. All simulations were in good agreement with experimental results. In addition, a comparison of the proposed circuit with other memristor emulators was presented. © 2018
Anahtar Kelimeler
Tam Kayıt
| Alan | Değer | Dil |
|---|---|---|
| dc.contributor.author | Gul, Fatih | |
| dc.contributor.author | Babacan, Yunus | |
| dc.date.accessioned | 2026-10-18T20:28:50.223048827Z | |
| dc.date.available | 2026-10-18T20:28:50.223048827Z | |
| dc.date.issued | 2018 | |
| dc.description.abstract | A semiconductor memristor device based on a 300-nm ZnO thin film was fabricated by direct-current reactive sputter. The memristive behavior of this device was confirmed by time dependent current–voltage (I-V-t) measurements, and the distinctive pinched hysteresis I-V loops of the memristor were observed. Structural analysis of the ZnO memristor was carried out using both X-ray powder diffraction (XRD) and scanning electron microscopy (SEM). After physical implementation of the memristor, an operational transconductance amplifier (OTA) based memristor circuit was designed to emulate the ZnO-based semiconductor memristor for use in memristor-based circuit applications. All simulations were in good agreement with experimental results. In addition, a comparison of the proposed circuit with other memristor emulators was presented. © 2018 | |
| dc.identifier.doi | 10.1016/j.mee.2018.03.012 | |
| dc.identifier.eissn | 1873-5568 | |
| dc.identifier.endpage | 60 | |
| dc.identifier.issn | 0167-9317 | |
| dc.identifier.scopus | 2-s2.0-85043985526 | |
| dc.identifier.startpage | 56 | |
| dc.identifier.uri | https://rdlopen.rawdatalibrary.net/r/ebyu/14045 | |
| dc.identifier.volume | 194 | |
| dc.identifier.wos | WOS:000433265900010 | |
| dc.language.iso | en | |
| dc.publisher | Elsevier B.V. | |
| dc.relation.ispartof | Microelectronic Engineering | |
| dc.rights | info:eu-repo/semantics/openAccess | |
| dc.subject | Memristor | |
| dc.subject | Memristor emulator | |
| dc.subject | OTA | |
| dc.subject | Zinc oxide | |
| dc.subject | Circuit simulation | |
| dc.subject | II-VI semiconductors | |
| dc.subject | Magnetic semiconductors | |
| dc.subject | Operational amplifiers | |
| dc.subject | Oxide semiconductors | |
| dc.subject | Reactive sputtering | |
| dc.subject | Scanning electron microscopy | |
| dc.subject | Semiconducting zinc compounds | |
| dc.subject | Timing circuits | |
| dc.subject | Wide band gap semiconductors | |
| dc.subject | X ray powder diffraction | |
| dc.subject | Circuit application | |
| dc.subject | Direct current | |
| dc.subject | Memristive behavior | |
| dc.subject | Operational transconductance amplifiers (OTA) | |
| dc.subject | OTA-based circuit | |
| dc.subject | Time-dependent currents | |
| dc.subject | ZnO thin film | |
| dc.subject | Memristors | |
| dc.title | A novel OTA-based circuit model corroborated by an experimental semiconductor memristor | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| rdl.citation.scopus | 29 | |
| rdl.citation.wos | 27 | |
| rdl.source.index | SCOPUS | |
| rdl.source.index | WOS | |
| rdl.wos.index | Science Citation Index Expanded (SCI-EXPANDED) |
